"Overall this course was above my expectations and I consider it the best course I've ever attended in terms of organization, instructors and their knowledge on XRF."
- Blair, J. -
"All the teachers are excellent, have a great dynamic with each other. They are what make this course unique."
- Vivien K. -
It is a tightly integrated two-week course on the fundamentals, instrumentation, qualitative analysis, sample preparation, quantitative analysis and data reduction methods and software of X-Ray Fluorescence Spectrometry (XRFS). It is designed to enable participants to have a good understanding of the XRFS technique and its applications, as well as to develop the skills for successfully carrying out routine analysis. Emphasis is given on practical applications.
The participants, after completion of the course, will have a good knowledge of the components of a modern X-ray spectrometer, how to set up a spectrometer, and the knowledge of different methods of data reduction for the determination of elements at the major, minor and trace levels.
This course has been recommended by the major X-ray fluorescence spectrometer manufacturers to their users as a basic training requirement for successfully carrying out routine analysis.
All participants and lecturers will stay at a university residence. This will provide additional opportunities for discussion between participants and lecturers during the course. In addition to the short course, two special topical workshops are planned for the 2017 session.
XRF2018 Short Course
June 18 to June 29, 2018 at Hamilton College, Clinton, N.Y., 13323 U.S.A.
XRF2018 Sample Prep Workshop
June 22, 2018 at Hamilton College, Clinton, N.Y., 13323 U.S.A.
"Basic Principles Underlying the FP Approach for Quantitative Analysis" by Professor J.P. Willis.
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Course Coordinator: Dr. Charles Wu info@LondonXrayConsultingGroup.com